Star Tech Instruments is the world leader in X-ray, EUV, DUV and UV light and beam analysis. We specialize in offering unique solutions and reliable measurements from 1 - 410 nm with vacuum capabilities to 10 -10 torr. and NIST traceability from 5 nm – 405 nm.
High Resolution
Wide Field of View
NIST Traceable
n-line measurements
High Damage Threshold
High Linearity
Real-time measurements
Polarization Insensitive
Beam Uniformity
Vacuum compatibility to 10-10 torr
1 Billion+ pulses
High Resolution
Wide, Flat, Field of View
Polarization Insensitive
High Damage Threshold
High Damage Threshold
1 Billion+ pulses
Vacuum compatibility to 10-10 torr
Multiple camera formats from .3 to 1.2
Optional NIST traceability
Net 30 accounts are welcome with credit approval.
Star Tech Instruments accepts Mastercard and Visa for other cards or payment options please contact STI.