Star Tech Instruments has just released our newest products for measuring energy and beam images/profiles in the X-ray, XUV, EUV wavelengths from 1 - 410 nm.
STI now offers Instruments with NIST traceability from 5 nm to 410 nm and measurement capability down to 1 nm.
Energy measurement in the XUV and X-ray normally require a vacuum and STI provides systems with vacuum ratings to 10-10 Torr. We offer multiple aperture options to 38 mm standard and larger if requested.
Beam shape and energy distribution in the XUV and X-ray is a growing requirement and STI has a solution. We have been working with a large National lab to test these systems to 5 nm and we have had very good results both in resolution and performance. Beam sizes offered are 10 mm to 38 mm standard and larger if requested. Vacuum rating for these systems is to 10-10 Torr.
Contact us at: sales@startechinstruments.com
STI introduces our new calibration standard, models XUV-25 and XUV-18, with NIST traceability. Designed for OEM, Research and laboratory applications to measure energy in the X-ray and Extreme UV. The standard apertures are 25 and 18 mm with options to 35 mm. Systems may be supplied with vacuum compatibility to 1x10-10 torr.
Complete systems are offered with a highly stable digital amplifier with user selectable or auto gain up to 5 decades. Systems come standard with USB 2, Wi-Fi, and Bluetooth interfaces as well as BNC connections.
Aperture: 18, 25, 35 mm (standard, other sizes on request)
Wavelength Range: 1-200 nm (see chart)
Input: 1 nA to 9 mA peak
Analog output: 0.05-5 VDC
Dimensions: 2.5 x 1.0” XUV-18
2.73 x 2.0” XUV-25
Interface: Wi-Fi, Bluetooth, USB2, BNC
Gain: 4 Decades
040 µA
0-4 µA
0-400 nA
Power requirements: 110 v AC
Dimensions: 5.28 x 5.4 x 1.96"
The µBIP series is STI’s latest imaging system designed specifically for use with soft x-rays [1-200 nm]; it should not be used with high power longer wavelengths lasers such as 193 nm or 248 nm from excimer lasers which could cause severe internal damage. Most importantly, the system is designed for use with high vacuum chambers using our custom vacuum flange assembly for attaching the optical system to the vacuum chamber. The flanges are rated at 10-10 Torr.
Focus: Adjustable ± 0.35”
Image Rotation: Rotational adjustment about the optical axis for alignment to the camera sensor
Iris Diaphragm: Adjustable from fully closed to wide open.
Camera mount: Standard c-mount
Vacuum Flanges: Conflat® copper vacuum flange, 2.75”, 304 SS. To <10-10 Torr.
FoV: 11.5mm 2 with 7.5x Microscope Objective
Wavelength: 1.0 - 200 nm other wavelengths and designs available to 405 nm
Resolution: (0.6 µm)
Magnification: 7.5x/ 10x
OAL: 16.25-16.95”
Vacuum Flange: 2.75” diam. With a 2.312” hole pattern
Values calculated using1” sensor. Actual values will be determined by the pixel size and overall size of the camera sensor.Measurements were taken with sensor-2048 x 2048, 11.3 x 11.3 mm, 5.5 μm pixel, 4.2 Mega pixel camera.
Values calculated using1” sensor. Actual values will be determined by the pixel size and overall size of the camera sensor. Measurements were taken with sensor-2048 x 2048, 11.3 x 11.3 mm, 5.5 μm pixel, 4.2 Mega pixel camera.