Star Tech Instruments has just released our newest products for measuring energy and beam images/profiles in the X-ray, XUV, EUV wavelengths from 1 - 410 nm.

STI now offers Instruments with NIST traceability from 5 nm to 410 nm and measurement capability down to 1 nm.

Energy Probes for X-ray
(1 nm to 200 nm)

Energy measurement in the XUV and X-ray normally require a vacuum and STI provides systems with vacuum ratings to 10-10 Torr. We offer multiple aperture options to 38 mm standard and larger if requested.

X-ray Beam Profiler and Imager
(1 nm to 200 nm)

Beam shape and energy distribution in the XUV and X-ray is a growing requirement and STI has a solution. We have been working with a large National lab to test these systems to 5 nm and we have had very good results both in resolution and performance. Beam sizes offered are 10 mm to 38 mm standard and larger if requested. Vacuum rating for these systems is to 10-10 Torr.

  • NIST Traceable (5nm to 200 nm)
  • High Transmission
  • No Microphonics
  • Low Noise
  • Minimal Long-term Drift
  • Polarization Insensitive
  • High Damage Threshold to 500 mJ/cm2
  • Full Range of Input Apertures
  • Wide Wavelength Range 1 nm to 200 nm*
  • Extremely Linear
  • Wide Field of View
  • Wide Field input apertures

Contact us at: sales@startechinstruments.com

  • Beam Profile/ Image
  • High Resolution to 0.6 µm
  • Wide Field of View
  • High Damage Threshold to 500 mJ/cm2
  • 1 Billion+ pulses without damage
  • Polarization Insensitive
  • Full Range of Input Apertures
  • Wide Wavelength Range 1 nm to 200 nm*
  • Extremely Linear
  • Vacuum compatible to 10-10 Torr
  • Range of input apertures

X-ray NIST traceable Energy probes
1 nm to 200 nm

STI introduces our new calibration standard, models XUV-25 and XUV-18, with NIST traceability. Designed for OEM, Research and laboratory applications to measure energy in the X-ray and Extreme UV. The standard apertures are 25 and 18 mm with options to 35 mm. Systems may be supplied with vacuum compatibility to 1x10-10 torr.

Complete systems are offered with a highly stable digital amplifier with user selectable or auto gain up to 5 decades. Systems come standard with USB 2, Wi-Fi, and Bluetooth interfaces as well as BNC connections.

  • NIST Traceable (5nm to 200 nm)
  • High Transmission
  • No Microphonics
  • Low Noise
  • Minimal Long-term Drift
  • Polarization Insensitive
  • High Damage Threshold to 500 mJ/cm2
  • Full Range of Input Apertures
  • Wide Wavelength Range 1 nm to 200 nm*
  • Extremely Linear
  • Wide Field of View
  • 1 Billion + Pulses

Probe XUV-18/25

Aperture: 18, 25, 35 mm (standard, other sizes on request)

Wavelength Range: 1-200 nm (see chart)

Input: 1 nA to 9 mA peak

Analog output: 0.05-5 VDC

Dimensions: 2.5 x 1.0” XUV-18

2.73 x 2.0” XUV-25

Amplifier UWF2-200

Interface: Wi-Fi, Bluetooth, USB2, BNC

Gain: 4 Decades
040 µA
0-4 µA
0-400 nA

Power requirements: 110 v AC

Dimensions: 5.28 x 5.4 x 1.96"

X-ray Beam Profile and Imaging 1 nm to 200 nm

beam-img11

uBIP-25Beam Profiler 1 nm-200nm

The µBIP series is STI’s latest imaging system designed specifically for use with soft x-rays [1-200 nm]; it should not be used with high power longer wavelengths lasers such as 193 nm or 248 nm from excimer lasers which could cause severe internal damage. Most importantly, the system is designed for use with high vacuum chambers using our custom vacuum flange assembly for attaching the optical system to the vacuum chamber. The flanges are rated at 10-10 Torr.

Features:

Focus: Adjustable ± 0.35”

Image Rotation: Rotational adjustment about the optical axis for alignment to the camera sensor

Iris Diaphragm: Adjustable from fully closed to wide open.

Camera mount: Standard c-mount

Vacuum Flanges: Conflat® copper vacuum flange, 2.75”, 304 SS. To <10-10 Torr.

Specifications:

FoV: 11.5mm 2 with 7.5x Microscope Objective

Wavelength: 1.0 - 200 nm other wavelengths and designs available to 405 nm

Resolution: (0.6 µm)

Magnification: 7.5x/ 10x

OAL: 16.25-16.95”

Vacuum Flange: 2.75” diam. With a 2.312” hole pattern

Values calculated using1” sensor. Actual values will be determined by the pixel size and overall size of the camera sensor.Measurements were taken with sensor-2048 x 2048, 11.3 x 11.3 mm, 5.5 μm pixel, 4.2 Mega pixel camera.

Resolution:

Values calculated using1” sensor. Actual values will be determined by the pixel size and overall size of the camera sensor. Measurements were taken with sensor-2048 x 2048, 11.3 x 11.3 mm, 5.5 μm pixel, 4.2 Mega pixel camera.