X-ray to 410 nm Vacuum and non-Vacuum systems
- • Energy/ Power
- • High Resolution
- • Wide Field of View
- • NIST Traceable 5 - 405 nm
- • In-line measurements
- • Beam Uniformity
- • Polarization Insensitive
- • High Damage Threshold
- • High Linearity
- • Real-time
XUV-18G Energy Probe
NIST Traceable
X-ray and XUV