Specialist in the Analysis and measurement of beams from 1 nm to 410 nm since 1989
with NIST traceability
Star Tech Instruments is the world leader in X-ray, EUV, DUV and UV light and beam analysis. We specialize in offering unique solutions and reliable measurements from 1 - 410 nm with vacuum capabilities to 10 -10 torr. and NIST traceability from 5 nm – 405 nm.
NIST calibration
High damage Threshold
1 Billion+ pulses with no damage
High Resolution
Wide Field of View
In-line measurement
Real-time measurements
Polarization insensitive
High beam uniformity
Vacuum compatible to 10-10 torr.
NIST calibration
High damage Threshold
1 Billion+ pulses with no damage
High Resolution
Wide Field of View
Compatible with most camera formats
Real-time measurements
Polarization insensitive
High beam uniformity
Vacuum compatible to 10-10 torr.
Net 30 accounts are welcome with credit approval.
Star Tech Instruments accepts Mastercard and Visa for other cards or payment options please contact STI.